$22
CEI EN 62979
2018
Photovoltaic module – Bypass diode – Thermal runaway test
- Format:
- Language(s) :
- Published :
- English
- 03/01/2018
This document provides a method for evaluating whether a bypass diode as mounted in the module is susceptible to thermal runaway or if there is sufficient cooling for it to survive the transition from forward bias operation to reverse bias operation without overheating.
This test methodology is particularly suited for testing of Schottky barrier diodes, which have the characteristic of increasing leakage current as a function of reverse bias voltage at high temperature, making them more susceptible to thermal runaway.
The test specimens which employ P/N diodes as bypass diodes are exempted from the thermal runaway test required herein, because the capability of P/N diodes to withstand the reverse bias is sufficiently high.
| CEI EN 62979 | |
|---|---|
| STANDARD INFO: | |
| Standard Name | CEI EN 62979 |
| Scope | Photovoltaic module - Bypass diode - Thermal runaway test |
| Publisher | CEI - Comitato Elettrotecnico Italiano |
| Languages | English |
| State | [ Active ] |
| Publication Year | 2018 |
| Most recent Version | MOST RECENT |
| Whether to be replaced | |
| Addendum | |
| FILE INFO: | |
| Edition | 18 |
| File Size | 1 file , 2.1 MB |
| Number of Pages | 22 |
| Published | 03/01/2018 |
| CEI EN 62979 | ||
|---|---|---|
| History | Publisher Year | |
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