$53
CEI EN IEC 60749-28
2022
Semiconductor devices – Mechanical and climatic test methods Part 28: Electrostatic discharge (ESD) sensitivity testing – Charged device model (CDM) – device level
- Format:
- Language(s) :
- Published :
- English
- 11/01/2022
ENGLISH
This part of IEC 60749 establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD). All packaged semiconductor devices, thin film circuits, surface acoustic wave (SAW) devices, opto-electronic devices, hybrid integrated circuits (HICs), and multi-chip modules (MCMs) containing any of these devices are to be evaluated according to this document. To perform the tests, the devices are assembled into a package similar to that expected in the final application. This CDM document does not apply to socketed discharge model testers. This document describes the field-induced (FI) method. An alternative, the direct contact (DC) method, is described in Annex J.
The purpose of this document is to establish a test method that will replicate CDM failures and provide reliable, repeatable CDM ESD test results from tester to tester, regardless of device type. Repeatable data will allow accurate classifications and comparisons of CDM ESD sensitivity levels.
| CEI EN IEC 60749-28 | |
|---|---|
| STANDARD INFO: | |
| Standard Name | CEI EN IEC 60749-28 |
| Scope | Semiconductor devices - Mechanical and climatic test methods Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level |
| Publisher | CEI - Comitato Elettrotecnico Italiano |
| Languages | English |
| State | [ Active ] |
| Publication Year | 2022 |
| Most recent Version | MOST RECENT |
| Whether to be replaced | |
| Addendum | |
| FILE INFO: | |
| Edition | 22# |
| File Size | 1 file , 4.5 MB |
| Number of Pages | 56 |
| Published | 11/01/2022 |
| CEI EN IEC 60749-28 | ||
|---|---|---|
| History | Publisher Year | |
| CEI EN IEC 60749-28 | 2022 | Current |
| CEI EN 60749-28 | 2017 |
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