$48
CEI EN IEC 61967-4
2022
Integrated circuits – Measurement of electromagnetic emissions Part 4: Measurement of conducted emissions – 1 Ω /150 Ω direct coupling method
- Format:
- Language(s) :
- Published :
- English
- 01/01/2022
ENGLISH
This part of IEC 61967 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe and RF voltage measurement using a 150 Ω coupling network. These methods ensure a high degree of reproducibility and correlation of EME measurement results.
| CEI EN IEC 61967-4 | |
|---|---|
| STANDARD INFO: | |
| Standard Name | CEI EN IEC 61967-4 |
| Scope | Integrated circuits - Measurement of electromagnetic emissions Part 4: Measurement of conducted emissions - 1 Ω /150 Ω direct coupling method |
| Publisher | CEI - Comitato Elettrotecnico Italiano |
| Languages | English |
| State | [ Active ] |
| Publication Year | 2022 |
| Most recent Version | MOST RECENT |
| Whether to be replaced | |
| Addendum | |
| FILE INFO: | |
| Edition | 22# |
| File Size | 1 file , 5 MB |
| Number of Pages | 52 |
| Published | 01/01/2022 |
| CEI EN IEC 61967-4 | ||
|---|---|---|
| History | Publisher Year | |
| CEI EN IEC 61967-4 | 2022 | Current |
| CEI EN 61967-4 | 2009 |
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