IEEE 1149.4-2010

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IEEE 1149.4-2010

2011

Most Recent

IEEE Standard for a Mixed-Signal Test Bus

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Revision Standard – Inactive-Reserved.
The testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to, both analog and digital test data. Sample implementation and application details (which are not part of the standard) are included for illustration. Also, extensions to the standard BSDL are defined that allow description of key component-specific aspects of such testability features.

IEEE 1149.4-2010
STANDARD INFO:
Standard NameIEEE 1149.4-2010
ScopeIEEE Standard for a Mixed-Signal Test Bus
PublisherIEEE - IEEE
LanguagesEnglish
State
Publication Year2011
Most recent VersionMOST RECENT
Whether to be replaced
Addendum
FILE INFO:
File Size1 file , 1.3 MB
ISBN(s)9780738165233, 9780738165240
NoteThis product is unavailable in Russia, Ukraine, Belarus
Number of Pages116
Product Code(s)STD97064, STDRES97064, STDPD97064
Published03/18/2011
This document does not provide a preview.
IEEE 1149.4-2010
HistoryPublisher Year
IEEE 1149.4-20102011Current
IEEE 1149.4-19992000

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