$19
CEI EN 60749-7
2012
Semiconductor devices – Mechanical and climatic test methods Part 7: Internal moisture content measurement and the analysis of other residual gases
- Format:
- Language(s) :
- Published :
- English
- 06/01/2012
SAME AS IEC 60749-7
This International Standard specifies the testing and
measurement of water vapour and other gas content of the atmosphere
inside a metal or ceramic hermetically sealed device. The test is
used as a measure of the quality of the sealing process and to
provide information about the long-term chemical stability of the
atmosphere inside the package. It is applicable to semiconductor
devices sealed in such a manner but generally only used for high
reliability applications such as military or aerospace. This test
is destructive.
| CEI EN 60749-7 | |
|---|---|
| STANDARD INFO: | |
| Standard Name | CEI EN 60749-7 |
| Scope | Semiconductor devices - Mechanical and climatic test methods Part 7: Internal moisture content measurement and the analysis of other residual gases |
| Publisher | CEI - Comitato Elettrotecnico Italiano |
| Languages | English |
| State | [ Active ] |
| Publication Year | 2012 |
| Most recent Version | MOST RECENT |
| Whether to be replaced | |
| Addendum | |
| FILE INFO: | |
| Edition | 12 |
| File Size | 1 file , 800 KB |
| Number of Pages | 16 |
| Published | 06/01/2012 |
| CEI EN 60749-7 | ||
|---|---|---|
| History | Publisher Year | |
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