$34
CEI EN 61967-2
2006
Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 2: Measurement of radiated emissions, TEM cell and wideband TEM cell method
- Format:
- Language(s) :
- Published :
- English
- 07/01/2006
La presente Norma descrive un metodo per la misura delle radiazioni elettromagnetiche emesse da un circuito integrato (IC).
Il circuito da provare è montato su una scheda di circuito stampato fissata ad una porta di accoppiamento disaccoppiata nella parte superiore o inferiore di una TEM (cellula trasversale elettromagnetica) o di una GTEM (TEM a larga banda).
Il metodo è stato sviluppato usando una cella TEM o GTEM a 1 GHz.
La cella in prova è connessa all'ingresso di un analizzatore di spettro o ricevitore che misura le emissioni a RF irradiate dal circuito integrato e che impattano sul setto della cella.
Questa Norma viene pubblicata dal CEI nella sola lingua inglese in quanto particolarmente mirata a settori specialistici.
La presente Norma recepisce il testo originale inglese della Pubblicazione IEC e pertanto consta delle sole pagine dispari.
| CEI EN 61967-2 | |
|---|---|
| STANDARD INFO: | |
| Standard Name | CEI EN 61967-2 |
| Scope | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions, TEM cell and wideband TEM cell method |
| Publisher | CEI - Comitato Elettrotecnico Italiano |
| Languages | English |
| State | [ Active ] |
| Publication Year | 2006 |
| Most recent Version | MOST RECENT |
| Whether to be replaced | |
| Addendum | |
| FILE INFO: | |
| Edition | 1 |
| File Size | 1 file , 490 KB |
| Number of Pages | 30 |
| Published | 07/01/2006 |
| CEI EN 61967-2 | ||
|---|---|---|
| History | Publisher Year | |
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