$22
CEI EN IEC 60749-13
2018
Semiconductor devices – Mechanical and climatic test methods Part 13: Salt atmosphere
- Format:
- Language(s) :
- Published :
- English
- 08/01/2018
This part of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment.
The salt atmosphere test is considered destructive.
| CEI EN IEC 60749-13 | |
|---|---|
| STANDARD INFO: | |
| Standard Name | CEI EN IEC 60749-13 |
| Scope | Semiconductor devices - Mechanical and climatic test methods Part 13: Salt atmosphere |
| Publisher | CEI - Comitato Elettrotecnico Italiano |
| Languages | English |
| State | [ Active ] |
| Publication Year | 2018 |
| Most recent Version | MOST RECENT |
| Whether to be replaced | |
| Addendum | |
| FILE INFO: | |
| Edition | 18 |
| File Size | 1 file , 1.8 MB |
| Number of Pages | 24 |
| Published | 08/01/2018 |
| CEI EN IEC 60749-13 | ||
|---|---|---|
| History | Publisher Year | |
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