$17
CEI EN IEC 60749-5
2024
Semiconductor devices – Mechanical and climatic test methods – Part 5: Steady-state temperature humidity bias life test
- Format:
- Language(s) :
- Published :
- English
- 04/01/2024
ENGLISH
This part of IEC 60749 provides a steady-state temperature and humidity bias life test to evaluate the reliability of non-hermetic packaged semiconductor devices in humid environments.
This test method is considered destructive.
| CEI EN IEC 60749-5 | |
|---|---|
| STANDARD INFO: | |
| Standard Name | CEI EN IEC 60749-5 |
| Scope | Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test |
| Publisher | CEI - Comitato Elettrotecnico Italiano |
| Languages | English |
| State | [ Active ] |
| Publication Year | 2024 |
| Most recent Version | MOST RECENT |
| Whether to be replaced | |
| Addendum | |
| FILE INFO: | |
| Edition | 24# |
| File Size | 1 file , 1.5 MB |
| Number of Pages | 18 |
| Published | 04/01/2024 |
| CEI EN IEC 60749-5 | ||
|---|---|---|
| History | Publisher Year | |
| CEI EN IEC 60749-5 | 2024 | Current |
| CEI EN 60749-5 | 2017 | |
| CEI EN 60749-5 | 2005 |
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