DIN EN IEC 60749-30

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DIN EN IEC 60749-30

2023

Most Recent

Semiconductor devices – Mechanical and climatic test methods – Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 60749-30:2020); German version EN IEC 60749-30:2020

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Semiconductor devices – Mechanical and climatic test methods – Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 60749-30:2020); German version EN IEC 60749-30:2020

DIN EN IEC 60749-30
STANDARD INFO:
Standard NameDIN EN IEC 60749-30
ScopeSemiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 60749-30:2020); German version EN IEC 60749-30:2020
PublisherDIN - DIN EN IEC
LanguagesGerman
State
Publication Year2023
Most recent VersionMOST RECENT
Whether to be replaced
Addendum
FILE INFO:
File Size1 file
Number of Pages17
Product Code(s)3386369, 3386369, 3386369
Published02/01/2023
This document does not provide a preview.

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