$183
IEC 61164 Ed. 2.0 b:2004
2004
Reliability growth – Statistical test and estimation methods
- Format:
- Language(s) :
- Published :
- English, French
- 03/24/2004
IEC 61164:2004 gives models and numerical methods for reliability growth assessments based on failure data, which were generated in a reliability improvement programme. These procedures deal with growth, estimation, confidence intervals for product reliability and goodness-of-fit tests. The main changes with respect to the previous edition are:
– addition of two statistical models for reliability growth planning and tracking in the product design phase;
– statistical methods for the reliability growth programme in the design phase of IEC 61014;
– addition of the discrete reliability growth model for the test phase;
– addition of the fixed number of faults model for the test phase, clarification of the symbols used for various models;
– addition of real lif examples for most of the statistical models;
– numerical correction of tables in the reliability growth test example. This standard should be used in conjunction with IEC 61014.
| IEC 61164 Ed. 2.0 b:2004 | |
|---|---|
| STANDARD INFO: | |
| Standard Name | IEC 61164 Ed. 2.0 b:2004 |
| Scope | Reliability growth - Statistical test and estimation methods |
| Publisher | IEC - International Electrotechnical Commission |
| Languages | English, French |
| State | |
| Publication Year | 2004 |
| Most recent Version | MOST RECENT |
| Whether to be replaced | |
| Addendum | |
| FILE INFO: | |
| Edition | 2.0 |
| File Size | 1 file , 810 KB |
| Note | This product is unavailable in Ukraine, Russia, Belarus |
| Number of Pages | 111 |
| Published | 03/24/2004 |
| IEC 61164 Ed. 2.0 b:2004 | ||
|---|---|---|
| History | Publisher Year | |
| IEC 61164 Ed. 2.0 b:2004 | 2004 | Current |
| IEC 61164 Ed. 2.0 en:2004 | 2004 |
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