$65
IEEE C62.35-2010
2010
IEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components
- Format:
- Language(s) :
- Published :
- English
- 08/31/2010
Revision Standard – Superseded.
Superseded by C62.59-2019. Avalanche breakdown diodes used for surge protection in systems with voltages equal to or less than 1000 V rms or 1200 V dc are discussed in this standard. The avalanche breakdown diode surge suppressor is a semiconductor diode which can operate in either the forward or reverse direction of its V-I characteristic. This component is a single package, which may be assembled from any combination of series and/or parallel diode chips.
| IEEE C62.35-2010 | |
|---|---|
| STANDARD INFO: | |
| Standard Name | IEEE C62.35-2010 |
| Scope | IEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components |
| Publisher | IEEE - IEEE |
| Languages | English |
| State | |
| Publication Year | 2010 |
| Most recent Version | MOST RECENT |
| Whether to be replaced | |
| Addendum | |
| FILE INFO: | |
| File Size | 1 file , 420 KB |
| ISBN(s) | 9780738162584, 9780738162577 |
| Note | This product is unavailable in Russia, Belarus |
| Number of Pages | 26 |
| Product Code(s) | STDSU96064 |
| Published | 08/31/2010 |
| IEEE C62.35-2010 | ||
|---|---|---|
| History | Publisher Year | |
| IEEE C62.35-2010 | 2010 | Current |
| IEEE C62.35-1987 | 1989 |
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